Testing, sorting, packaging and testing. And then some more testing. When you purchase through links on our site, we may earn an affiliate commission. Here’s how it works. The world of ...

The MM5622 system-in-package (SiP) solution fully integrates a driver, charge pump and 12 high Source: Menlo Microsystems, ...

We aim to enable our customers to implement new and specific test protocols dedicated to MRAM wafer sort and to successfully tackle ramp-up in high-volume manufacturing. The new-generation test ...

The company's services include Wafer Sort, Assembly, RF Testing and other services. Through its first wholly-owned subsidiary Inari Technology Sdn. Bhd., the company provides DC and RF wafer ...

Smartphone and tablet manufacturers have begun to mandate the use of PAT by their semiconductor suppliers, and test operations groups are starting to deploy the process at their wafer sort and/or ...

ElectroMagnetic Wafer Sort (EMWS) is an evolution of Electrical Wafer Sort (EWS), the last stage of wafer fabrication before assembly and test of the final packaged products. At this stage in the ...

For wafer test (sort or probe), this interface hardware is called a probe card, and prober equipment manages the physical process of touching a probe tip onto a die pad/bump. Consider first the ...

and the T5835 high-speed wafer-sort interface option. The T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for ...