Find more information on the Altmetric Attention Score and how the score is calculated. We show how a scanning probe microscope (SPM) can be used to image electron flow through InAs nanowires, ...

The added feature allows non-contact probing of die pads and provides a reliable alternative solution to mechanical probing for electrical wafer sort ... reduction of the force required to create ...

University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision ...

An international research team led by the Paul Scherrer Institute PSI has measured the radius of the nucleus of muonic helium ...

Fraunhofer ISE researchers say their newly fabricated gallium arsenide substrates (InP-on-GaAs wafers) can replace prime ...