University of Illinois Physics Professor Paul Kwiat and members of his research group have developed a new tool for precision ...

An international research team led by the Paul Scherrer Institute PSI has measured the radius of the nucleus of muonic helium ...

Fraunhofer ISE researchers say their newly fabricated gallium arsenide substrates (InP-on-GaAs wafers) can replace prime ...

deliver and operate an operational prototype spacecraft for the Space Force." — Astroscale aims to capture old space junk with robotic arm in 2026 (exclusive video) — Private space-junk probe ...

FormFactor, Inc. (NASDAQ:FORM), a recognized supplier in electrical test and measurement technologies with annual revenues of $763.6 million, announced the launch of its latest product, the EVOLVITY™ ...

NORTH READING, Mass., March 31, 2025--(BUSINESS WIRE)--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics ...

Outlining a disturbing pattern of student suicides in educational institutions, the Supreme Court on Monday directed Delhi Police to register an FIR and probe ... National Task Force to address ...

Certainly the vertical probe card is a reliable solution to satisfy these requirements of bump wafer probing. In this paper, the mechanism of bump wafer probing is investigated and the relationships ...

Often they also cooperate with ministries, state agencies, or even with lawmakers,” said Fahmy, who was a member of the anti-oil mafia task force established in 2014 during former president Joko ...

Abstract: Mechanical contact caused using excessive probe force produces an oversized scrubbing mark that may result in damage to the die pad and the silicon chip breaking for thin wafer. Therefore, ...