Welcome to the Aehr Test Systems ... it will ruin your probe card. So when people -- when we first engage them, they're like, this is absolutely impossible because every wafer, I have a device ...

The new test cell integrates Teradyne's UltraFLEXplus automated test equipment (ATE) and programming environment, IG-XL, with ficonTEC's advanced optical alignment, probing, and wafer handling ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results. STAr Virgo ...

The WaferPak Contactor contains a full-wafer single-touchdown probe card ... the entire chip, Aehr's systems are a clear choice for manufacturers. Aehr's systems, with long burn-in test times ...

You may like Intel outlines new Foundry roadmap with strong AI focus for new nodes TSMC takes 'chip binning' to a whole new level as entire wafer 'found ... it to a probe card which contains ...