When visiting the dentist, you might remember being poked and prodded by a thin metal instrument to check your teeth and gums ...

Infineon’s rad-hard GaN HEMT is the first in-house device qualified to JANS MIL-PRF-19500/794, DLA’s highest quality grade.

A recent technical paper titled “Factors determining bond wave speed in wafer bonding” was published by researcher at ...

Wafer level package for ... seal ring/isolation boundary of the device, there-by providing much higher performance for the packaged devices. The reliability of this new WLP technology has been ...

The obtained performance has been also compared with a traditional single-coil excitation probe based on the same sensing element. The experimental analysis demonstrated the appreciable performance of ...