The wafer inspection business is heating up as chipmakers encounter new and tiny killer defects in advanced devices. Last month ASML Holding entered into an agreement to acquire Hermes Microvision ...
TOKYO, Dec 14, 2021 - (JCN Newswire) - Hitachi High-Tech Corporation today announced the Development of its Electron Beam Area Inspection System GS1000. This, newly developed tool, offers precise and ...
MILPITAS, Calif., July 20, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results