Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
The Thermo Scientific Talos F200C TEM is a 20-200 kV thermionic (scanning) transmission electron microscope that has been specifically designed to ensure performance and productivity across a wide ...
Last November, Quantum Design and NanoMEGAS invited industry and research professionals to learn more about the theoretical and practical applications of Precession Electron Diffraction (PED).
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