Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong ... or develop analog-to-digital converter test content, ...

To optimize the cleaning interval, a new technique called adaptive probe-card cleaning (APC) employs artificial intelligence ...

Getting to the punch line is going to require some IC fabrication background, but if you like stories about silicon, or red-bearded test ... wafer probe card into the top of the machine, needles ...

Today�s newest memory, mixed-signal, digital ... Most fine-pitch wafer test applications use cantilevered epoxy-ring probe cards made with small-diameter probe needles.

June 01, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and production burn-in equipment, today announced a new silicon carbide semiconductor ...

By ensuring that the UltraFLEXplus is compatible with industry-leading optical instrumentation, probers, alignment systems, and probe cards ... sided test cell for silicon photonics wafer test ...

test signals from a measuring instrument or tester are transmitted to individual devices on a wafer via probe needles or a probe card, and the signals are then returned from the device.

Wafer probing is ... the complexity of the test-program design and impacts the silicon area. The I/O compression and BIST techniques have little impact on probe-card design. Increasing parallelism ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles ... probe ...

Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...