Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

There is another way to investigate the domain of the very small: an atomic force microscope ... ranging from $20 to $500 per probe. Still, with these probes, [whoand] can look at the pits ...

A new mechanical membrane-based AFM (atomic force microscopy) probe is proposed for measuring interaction forces between its tip and a substrate together with the topography of the substrate. The ...