Results from PID stress tests can be misleading when bifacial PV modules are PID-stressed from just one side using the foil method in IEC TS 62804, according to a new study by Belgian researchers. An ...
Potential induced degradation (PID) of photovoltaic (PV) modules gets a lot of attention since 2010 when Solon published their findings about a degradation mechanism in their PV modules caused by high ...
Winaico, part of Win Win Precision Technology, announced that its WSP PV modules had passed potential-induced degradation (PID) testing conducted by TÜV Rheinland. As pointed out by PV-Tech, “PID is ...
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