A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Automated image analysis has transformed the traditional approach to colony counting in microbiology, offering objective, reproducible and high‐throughput solutions that overcome the labour-intensive ...

We offer high-end workstations computers (Analysis PC 1 ,2, and 3) for image processing and analysis. Our workstation computers allow for image analysis without hindering access to computers operating ...

The study of seed morphology has emerged as a critical element in plant taxonomy, facilitating both the systematic classification and the conservation of plant diversity. Traditional morphological ...