Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...

Livermore, Calif. — FormFactor, Inc. has expanded its TrueScale probe card family for wire bond system-on-chip (SoC) devices with the introduction of its PP40 wafer probe card. This probe card enables ...

Probe card demand for 3D ICs is promising, according to IC testing interface solution provider Chunghwa Precision Test Tech (CHPT), which also claimed it will be one of the new suppliers capable of ...

One of the most basic tools for tinkering with electronics is a multimeter. Today, even a cheap meter has capabilities that would have been either very expensive or unobtainable back in the 1970s.

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...