In a fight with such wafer-thin margins ... For legal reasons, Macfarlanes is also unable to publish any details of its probe. The investigation was commissioned after Rothschild passed on ...

Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process itself did not compromise wafer quality. But damage to a particular die on a wafer can ...

The brief was that the wafer probe yield was disastrous and the correlation wafer was not giving the correct results. Getting to the punch line is going to require some IC fabrication background ...

a semi-automated engineering wafer probe system that complements the company’s proven CM300 product line. The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design ...

High temperatures also induce thermal stresses in the tester which can affect the positioning of the test probes on the test pads. The problem is complicated by the dynamic nature of the testing ...

Please tell us about your performance wafer probe stations and advanced cantilever probe cards? What are the main features and benefits? Our wafer probe stations have been selected for many ...