yieldWerx operates at the semiconductor level, connecting data across wafer fabrication, wafer sort, die, and packaged device test. Its enterprise analytics platform enables advanced yield analysis, ...

Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.

Artificial intelligence is often discussed through chips, GPUs, data centers, and software models. But behind every AI server, accelerator card, networking switch, ...

Expertise from Forbes Councils members, operated under license. Opinions expressed are those of the author. So, what does this mean for the organizations that develop these products? It means that ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

In its simplest form, silicon validation ensures that the silicon meets its power, performance, area (PPA), and reliability ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...