Sample preparation is a very crucial step in TEM and the method involved in preparing the sample differs, depending on the nature of the material and the information required from it. Fixation ...

The PELCO ® Tripod Polisher™ 590 can be used to prepare TEM samples with less than 15 minutes of ion milling or, in some instances, with no need for ion milling whatsoever. The system was originally ...

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...

JEOL IB-19500CP low angle, low energy ion mill for SEM and TEM sample preparation. This instrument can be reserved for use.

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