“The CIRCL's DirectedSampling technology can be programmed to inspect and measure just what you want it to,” said Thomas Groos, senior product marketing manager. “For instance, it can inspect the ...
It is no mystery that the semiconductor industry is always advancing, with specifications becoming increasingly stringent as defects become increasingly more difficult to discover. This is especially ...
“Achieving yield and performance targets for advanced memory and logic devices requires very close monitoring of an exploding number of process parameters,” said Oreste Donzella, general manager of ...
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