LIVERMORE, Calif. — FormFactor Inc. here today (Feb. 15) announced a major advancement in probe-card technology that enables IC manufacturers to test up to 128 chips on a wafer with a single ...

Full test at wafer probe obtains yield information as quickly ... to the probe tip to eliminate any signal aberrations at the device. Another common technique for increasing parallelism in DRAM ...

test signals from a measuring instrument or tester are transmitted to individual devices on a wafer via probe needles or a probe card, and the signals are then returned from the device.

The introduction of the double-sided wafer probe test cell is expected to have a ... before wafers are diced and packaged into CPO devices or pluggable transceivers. The integration of Teradyne's ...

Full integration of FormFactor’s Velox™ probe station control and wafer-level measurement ... for production proven volume test of optical and electrical devices. Superior instrumentation ...

Aehr's FOX-XP system allows for seamless transition from device qualification to high-volume, fully automated multi-wafer testing. It can test up to nine wafers in parallel and is designed to ...