Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

A new 3D nanoscale imaging method now reveals how different passivation strategies reshape internal charge pathways offering ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Perovskite solar cells have garnered widespread attention as a low-cost, high-efficiency alternative to conventional silicon photovoltaics. However ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...